Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/91613
Title: Studies on ohmic and schottky contacts to gallium nitride
Researcher: Ramesha, C K
Guide(s): Reddy, Raajagopal V
Keywords: Gallium nitride, Current-voltage measurements, Surface morphology, X-ray diffraction, Transmission line method
University: University of Mysore
Completed Date: 2006
Abstract: Abstract not available newline newline
Pagination: xii, 100p.
URI: http://hdl.handle.net/10603/91613
Appears in Departments:Department of Electronics

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01_title.pdfAttached File275.62 kBAdobe PDFView/Open
02_certificate.pdf303.25 kBAdobe PDFView/Open
03_declaration.pdf147.23 kBAdobe PDFView/Open
04_acknowledgements.pdf53.59 kBAdobe PDFView/Open
05_abstract.pdf124.61 kBAdobe PDFView/Open
06_contents.pdf68.34 kBAdobe PDFView/Open
07_list of tables.pdf145.27 kBAdobe PDFView/Open
08_list of figures.pdf236.75 kBAdobe PDFView/Open
09_chapter 1.pdf1.46 MBAdobe PDFView/Open
10_chapter 2.pdf475.13 kBAdobe PDFView/Open
11_chapter 3.pdf3.28 MBAdobe PDFView/Open
12_chapter4.pdf3.81 MBAdobe PDFView/Open
13_chapter 5.pdf3.15 MBAdobe PDFView/Open
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