Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/91613
Title: | Studies on ohmic and schottky contacts to gallium nitride |
Researcher: | Ramesha, C K |
Guide(s): | Reddy, Raajagopal V |
Keywords: | Gallium nitride, Current-voltage measurements, Surface morphology, X-ray diffraction, Transmission line method |
University: | University of Mysore |
Completed Date: | 2006 |
Abstract: | Abstract not available newline newline |
Pagination: | xii, 100p. |
URI: | http://hdl.handle.net/10603/91613 |
Appears in Departments: | Department of Electronics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 275.62 kB | Adobe PDF | View/Open |
02_certificate.pdf | 303.25 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 147.23 kB | Adobe PDF | View/Open | |
04_acknowledgements.pdf | 53.59 kB | Adobe PDF | View/Open | |
05_abstract.pdf | 124.61 kB | Adobe PDF | View/Open | |
06_contents.pdf | 68.34 kB | Adobe PDF | View/Open | |
07_list of tables.pdf | 145.27 kB | Adobe PDF | View/Open | |
08_list of figures.pdf | 236.75 kB | Adobe PDF | View/Open | |
09_chapter 1.pdf | 1.46 MB | Adobe PDF | View/Open | |
10_chapter 2.pdf | 475.13 kB | Adobe PDF | View/Open | |
11_chapter 3.pdf | 3.28 MB | Adobe PDF | View/Open | |
12_chapter4.pdf | 3.81 MB | Adobe PDF | View/Open | |
13_chapter 5.pdf | 3.15 MB | Adobe PDF | View/Open |
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