1. Shodhganga@INFLIBNET
  2. Savitribai Phule Pune University
  3. Department of Physics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/90344
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2016-05-17T05:25:01Z-
dc.date.available2016-05-17T05:25:01Z-
dc.identifier.urihttp://hdl.handle.net/10603/90344-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleStudies on the radiation induced damages in MOS structures with applications to semiconductor dosimetry
dc.title.alternative
dc.creator.researcherKulkarni Vinodkumar Rajarampanth
dc.subject.keywordPhysics
dc.subject.keywordMOS structures
dc.subject.keywordSemiconductor dosimetry
dc.subject.keywordRadiation induced damages
dc.description.note
dc.contributor.guideDhole Sanjay D. Bhoraskar and V. N.
dc.publisher.placePune
dc.publisher.universitySavitribai Phule Pune University
dc.publisher.institutionDepartment of Physics
dc.date.registered17-03-2003
dc.date.completedDecember, 2011
dc.date.awarded11-05-2012
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File75.52 kBAdobe PDFView/Open
02_certificate.pdf78.88 kBAdobe PDFView/Open
03_declaration.pdf98.46 kBAdobe PDFView/Open
04_acknowledgement.pdf61.25 kBAdobe PDFView/Open
05_contents.pdf67.26 kBAdobe PDFView/Open
06_chapter1.pdf1.38 MBAdobe PDFView/Open
07_chapter2.pdf1.7 MBAdobe PDFView/Open
08_chapter3.pdf3.4 MBAdobe PDFView/Open
09_chapter4.pdf2.65 MBAdobe PDFView/Open
10_chapter5.pdf1.54 MBAdobe PDFView/Open
11_chapter6.pdf1.61 MBAdobe PDFView/Open
12_list_of_publications.pdf297.63 kBAdobe PDFView/Open
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