Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/90344
Title: | Studies on the radiation induced damages in MOS structures with applications to semiconductor dosimetry |
Researcher: | Kulkarni Vinodkumar Rajarampanth |
Guide(s): | Dhole Sanjay D. Bhoraskar and V. N. |
Keywords: | Physics MOS structures Semiconductor dosimetry Radiation induced damages |
University: | Savitribai Phule Pune University |
Completed Date: | December, 2011 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/90344 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 75.52 kB | Adobe PDF | View/Open |
02_certificate.pdf | 78.88 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 98.46 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 61.25 kB | Adobe PDF | View/Open | |
05_contents.pdf | 67.26 kB | Adobe PDF | View/Open | |
06_chapter1.pdf | 1.38 MB | Adobe PDF | View/Open | |
07_chapter2.pdf | 1.7 MB | Adobe PDF | View/Open | |
08_chapter3.pdf | 3.4 MB | Adobe PDF | View/Open | |
09_chapter4.pdf | 2.65 MB | Adobe PDF | View/Open | |
10_chapter5.pdf | 1.54 MB | Adobe PDF | View/Open | |
11_chapter6.pdf | 1.61 MB | Adobe PDF | View/Open | |
12_list_of_publications.pdf | 297.63 kB | Adobe PDF | View/Open |
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