Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/90344
Title: Studies on the radiation induced damages in MOS structures with applications to semiconductor dosimetry
Researcher: Kulkarni Vinodkumar Rajarampanth
Guide(s): Dhole Sanjay D. Bhoraskar and V. N.
Keywords: Physics
MOS structures
Semiconductor dosimetry
Radiation induced damages
University: Savitribai Phule Pune University
Completed Date: December, 2011
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/90344
Appears in Departments:Department of Physics

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01_title.pdfAttached File75.52 kBAdobe PDFView/Open
02_certificate.pdf78.88 kBAdobe PDFView/Open
03_declaration.pdf98.46 kBAdobe PDFView/Open
04_acknowledgement.pdf61.25 kBAdobe PDFView/Open
05_contents.pdf67.26 kBAdobe PDFView/Open
06_chapter1.pdf1.38 MBAdobe PDFView/Open
07_chapter2.pdf1.7 MBAdobe PDFView/Open
08_chapter3.pdf3.4 MBAdobe PDFView/Open
09_chapter4.pdf2.65 MBAdobe PDFView/Open
10_chapter5.pdf1.54 MBAdobe PDFView/Open
11_chapter6.pdf1.61 MBAdobe PDFView/Open
12_list_of_publications.pdf297.63 kBAdobe PDFView/Open
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