Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/80018
Title: X ray photon scattering cross section measurements and application in elemental analysis using EDXRF technique
Researcher: Shahi, Jangvir Singh
Guide(s): Singh, Nirmal
Keywords: Amplifier
Geometrical
Inelastic
Scattering
Technique
University: Panjab University
Completed Date: 31/08/2000
Abstract: Abstract available
Pagination: xi, 113p.
URI: http://hdl.handle.net/10603/80018
Appears in Departments:Department of Physics

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01_title page.pdfAttached File49.52 kBAdobe PDFView/Open
02_dedication.pdf23.19 kBAdobe PDFView/Open
03_acknowledgement.pdf57.54 kBAdobe PDFView/Open
04_content.pdf208.47 kBAdobe PDFView/Open
05_abstract.pdf451.04 kBAdobe PDFView/Open
06_chapter 1.pdf2.1 MBAdobe PDFView/Open
07_chapter 2.pdf2.65 MBAdobe PDFView/Open
08_chapter 3.pdf1.87 MBAdobe PDFView/Open
09_chapter 4.pdf1.85 MBAdobe PDFView/Open
10_chapter 5.pdf1.83 MBAdobe PDFView/Open
11_chapter 6.pdf2.04 MBAdobe PDFView/Open
12_appendix 1.pdf417.71 kBAdobe PDFView/Open
13_appendix 2.pdf67.66 kBAdobe PDFView/Open
14_appendix 3.pdf185.75 kBAdobe PDFView/Open
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