Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/79955
Title: X ray cross section measurements and application in elemental analysis using pixe technique
Researcher: Balouria, Pankaj
Guide(s): Govil, I M
Keywords: Application
Elemental
Measurements
Technique
X-Ray
University: Panjab University
Completed Date: 31/12/2009
Abstract: Abstract not available
Pagination: xiv, 106p.
URI: http://hdl.handle.net/10603/79955
Appears in Departments:Department of Physics

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01_title page.pdfAttached File44.32 kBAdobe PDFView/Open
02_dedication.pdf15.06 kBAdobe PDFView/Open
03_acknowledgement.pdf139.33 kBAdobe PDFView/Open
04_content.pdf204.91 kBAdobe PDFView/Open
05_list of figures.pdf172.53 kBAdobe PDFView/Open
06_list of table.pdf94.02 kBAdobe PDFView/Open
07_chapter 1.pdf1.79 MBAdobe PDFView/Open
08_chapter 2.pdf1.09 MBAdobe PDFView/Open
09_chapter 3.pdf4.34 MBAdobe PDFView/Open
10_chapter 4.pdf6.74 MBAdobe PDFView/Open
11_chapter 5.pdf4.61 MBAdobe PDFView/Open
12_chapter 6.pdf619.08 kBAdobe PDFView/Open
13_summary and conclusions.pdf297.88 kBAdobe PDFView/Open
14_list of publication.pdf1.16 MBAdobe PDFView/Open
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