1. Shodhganga@INFLIBNET
  2. Anna University
  3. Faculty of Science and Humanities
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/74044
Title: New optical configurations in speckle metrology for deformation measurements and contouring
Researcher: Santhanakrishnan, T
Guide(s): Palanisamy, PK
Keywords: Desensitized
Interferometry
Metrological
Speckle
Symmetric
University: Anna University
Completed Date: 31/05/1997
Abstract: Abstract available
Pagination: xxiii, 171p.
URI: http://hdl.handle.net/10603/74044
Appears in Departments:Faculty of Science and Humanities

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File16.08 kBAdobe PDFView/Open
02_certificate.pdf19.08 kBAdobe PDFView/Open
03_abstract.pdf120.31 kBAdobe PDFView/Open
04_acknowledgement.pdf28.5 kBAdobe PDFView/Open
05_table of contents.pdf126.91 kBAdobe PDFView/Open
06_list of tables.pdf10.41 kBAdobe PDFView/Open
07_list of figures.pdf214.24 kBAdobe PDFView/Open
08_list of symbols abbreviations and nomenclatures.pdf19.85 kBAdobe PDFView/Open
09_chapter 1.pdf1.09 MBAdobe PDFView/Open
10_chapter 2.pdf2.8 MBAdobe PDFView/Open
11_chapter 3.pdf971.72 kBAdobe PDFView/Open
12_chapter 4.pdf1.26 MBAdobe PDFView/Open
13_chapter 5.pdf2.24 MBAdobe PDFView/Open
14_chapter 6.pdf2.83 MBAdobe PDFView/Open
15_summary and conclusions.pdf324.82 kBAdobe PDFView/Open
16_references.pdf438.32 kBAdobe PDFView/Open
17_vitae.pdf21.95 kBAdobe PDFView/Open
18_list of publications.pdf87.9 kBAdobe PDFView/Open
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