Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/69067
Full metadata record
DC FieldValueLanguage
dc.coverage.spatialPhysics
dc.date.accessioned2016-01-08T06:43:38Z-
dc.date.available2016-01-08T06:43:38Z-
dc.identifier.urihttp://hdl.handle.net/10603/69067-
dc.description.abstractAbstract not available
dc.format.extentviii, 172p.
dc.languageEnglish
dc.relationReference available at chapters
dc.rightsuniversity
dc.titleDevelopment of 1 f noise measurement system and studies on thin films of CdO silver and semiconductor devices BJT and MOSFET
dc.title.alternative
dc.creator.researcherVedanayakam,S. Victor
dc.subject.keywordNoise
dc.subject.keywordFilms
dc.subject.keywordSilver
dc.subject.keywordSemiconductor
dc.subject.keywordDevices
dc.description.noteData not available
dc.contributor.guidePunyaseshudu,D.
dc.publisher.placeAnantapur
dc.publisher.universitySri Krishnadevaraya University
dc.publisher.institutionDepartment of Physics
dc.date.registeredn.d.
dc.date.completed30/04/2009
dc.date.awardedn.d.
dc.format.dimensions30cm.
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File30.34 kBAdobe PDFView/Open
02_certificate.pdf25.9 kBAdobe PDFView/Open
03_declaration.pdf21.82 kBAdobe PDFView/Open
04_acknowledgement.pdf52.32 kBAdobe PDFView/Open
05_content.pdf11.82 kBAdobe PDFView/Open
06_preface.pdf61.16 kBAdobe PDFView/Open
07_chapter 1.pdf1.18 MBAdobe PDFView/Open
08_chapter 2.pdf757.49 kBAdobe PDFView/Open
09_chapter 3.pdf1.26 MBAdobe PDFView/Open
10_chapter 4.pdf222.55 kBAdobe PDFView/Open
11_chapter 5.pdf5.25 MBAdobe PDFView/Open
12_chapter 6.pdf120.59 kBAdobe PDFView/Open


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: