Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/69067
Title: Development of 1 f noise measurement system and studies on thin films of CdO silver and semiconductor devices BJT and MOSFET
Researcher: Vedanayakam,S. Victor
Guide(s): Punyaseshudu,D.
Keywords: Noise
Films
Silver
Semiconductor
Devices
University: Sri Krishnadevaraya University
Completed Date: 30/04/2009
Abstract: Abstract not available
Pagination: viii, 172p.
URI: http://hdl.handle.net/10603/69067
Appears in Departments:Department of Physics

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01_title page.pdfAttached File30.34 kBAdobe PDFView/Open
02_certificate.pdf25.9 kBAdobe PDFView/Open
03_declaration.pdf21.82 kBAdobe PDFView/Open
04_acknowledgement.pdf52.32 kBAdobe PDFView/Open
05_content.pdf11.82 kBAdobe PDFView/Open
06_preface.pdf61.16 kBAdobe PDFView/Open
07_chapter 1.pdf1.18 MBAdobe PDFView/Open
08_chapter 2.pdf757.49 kBAdobe PDFView/Open
09_chapter 3.pdf1.26 MBAdobe PDFView/Open
10_chapter 4.pdf222.55 kBAdobe PDFView/Open
11_chapter 5.pdf5.25 MBAdobe PDFView/Open
12_chapter 6.pdf120.59 kBAdobe PDFView/Open
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