Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/69067
Title: | Development of 1 f noise measurement system and studies on thin films of CdO silver and semiconductor devices BJT and MOSFET |
Researcher: | Vedanayakam,S. Victor |
Guide(s): | Punyaseshudu,D. |
Keywords: | Noise Films Silver Semiconductor Devices |
University: | Sri Krishnadevaraya University |
Completed Date: | 30/04/2009 |
Abstract: | Abstract not available |
Pagination: | viii, 172p. |
URI: | http://hdl.handle.net/10603/69067 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title page.pdf | Attached File | 30.34 kB | Adobe PDF | View/Open |
02_certificate.pdf | 25.9 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 21.82 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 52.32 kB | Adobe PDF | View/Open | |
05_content.pdf | 11.82 kB | Adobe PDF | View/Open | |
06_preface.pdf | 61.16 kB | Adobe PDF | View/Open | |
07_chapter 1.pdf | 1.18 MB | Adobe PDF | View/Open | |
08_chapter 2.pdf | 757.49 kB | Adobe PDF | View/Open | |
09_chapter 3.pdf | 1.26 MB | Adobe PDF | View/Open | |
10_chapter 4.pdf | 222.55 kB | Adobe PDF | View/Open | |
11_chapter 5.pdf | 5.25 MB | Adobe PDF | View/Open | |
12_chapter 6.pdf | 120.59 kB | Adobe PDF | View/Open |
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