Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/68973
Title: | Micro computer based paper thickness gauge through opacity measurements |
Researcher: | Veerabhadrappa,C. |
Guide(s): | Khan,V. Hyder |
Keywords: | Micro-Computer Paper Thickness Gauge Measurements |
University: | Sri Krishnadevaraya University |
Completed Date: | 31/12/1992 |
Abstract: | Abstract not available |
Pagination: | xi, 53p. |
URI: | http://hdl.handle.net/10603/68973 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title page.pdf | Attached File | 16.15 kB | Adobe PDF | View/Open |
02_dedicated.pdf | 37.33 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 10.49 kB | Adobe PDF | View/Open | |
04_certificate.pdf | 18.5 kB | Adobe PDF | View/Open | |
05_content.pdf | 31.51 kB | Adobe PDF | View/Open | |
06_acknowledgement.pdf | 49.49 kB | Adobe PDF | View/Open | |
07_general summary.pdf | 26.72 kB | Adobe PDF | View/Open | |
08_chapter 1.pdf | 98.7 kB | Adobe PDF | View/Open | |
09_chapter 2.pdf | 172.69 kB | Adobe PDF | View/Open | |
10_chapter 3.pdf | 303.4 kB | Adobe PDF | View/Open | |
11_chapter 4.pdf | 506.68 kB | Adobe PDF | View/Open | |
12_references.pdf | 51.99 kB | Adobe PDF | View/Open |
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