Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/63944
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DC FieldValueLanguage
dc.coverage.spatialPhysics
dc.date.accessioned2015-12-23T10:05:07Z-
dc.date.available2015-12-23T10:05:07Z-
dc.identifier.urihttp://hdl.handle.net/10603/63944-
dc.description.abstractAbstract not available newline newline
dc.format.extentvi, 237p.
dc.languageEnglish
dc.relation-
dc.rightsuniversity
dc.titleCharacterisation of microstructure of some industrial materials by X_ray diffraction and other methods
dc.title.alternative-
dc.creator.researcherShee, Swapan Kumar
dc.subject.keywordCharacterisation, Microstructure, Industrial Materials, X_Ray Diffraction, Methods
dc.description.note-
dc.contributor.guideDe, Madhusudan and Pradhan, Swapan Kumar
dc.publisher.placeBardhaman
dc.publisher.universityThe University of Burdwan
dc.publisher.institutionDepartment of Physics
dc.date.registeredn.d.
dc.date.completed2005
dc.date.awardedn.d.
dc.format.dimensions-
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File24.45 kBAdobe PDFView/Open
02_certificate.pdf41.72 kBAdobe PDFView/Open
03_preface.pdf67.43 kBAdobe PDFView/Open
04_acknowledgements.pdf34.16 kBAdobe PDFView/Open
05_list of publications.pdf34.92 kBAdobe PDFView/Open
06_contents.pdf160.83 kBAdobe PDFView/Open
07_part i.pdf4.45 MBAdobe PDFView/Open
08_part ii.pdf8.08 MBAdobe PDFView/Open


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