Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/63944
Title: | Characterisation of microstructure of some industrial materials by X_ray diffraction and other methods |
Researcher: | Shee, Swapan Kumar |
Guide(s): | De, Madhusudan and Pradhan, Swapan Kumar |
Keywords: | Characterisation, Microstructure, Industrial Materials, X_Ray Diffraction, Methods |
University: | The University of Burdwan |
Completed Date: | 2005 |
Abstract: | Abstract not available newline newline |
Pagination: | vi, 237p. |
URI: | http://hdl.handle.net/10603/63944 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 24.45 kB | Adobe PDF | View/Open |
02_certificate.pdf | 41.72 kB | Adobe PDF | View/Open | |
03_preface.pdf | 67.43 kB | Adobe PDF | View/Open | |
04_acknowledgements.pdf | 34.16 kB | Adobe PDF | View/Open | |
05_list of publications.pdf | 34.92 kB | Adobe PDF | View/Open | |
06_contents.pdf | 160.83 kB | Adobe PDF | View/Open | |
07_part i.pdf | 4.45 MB | Adobe PDF | View/Open | |
08_part ii.pdf | 8.08 MB | Adobe PDF | View/Open |
Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).
Altmetric Badge: