Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/63944
Title: Characterisation of microstructure of some industrial materials by X_ray diffraction and other methods
Researcher: Shee, Swapan Kumar
Guide(s): De, Madhusudan and Pradhan, Swapan Kumar
Keywords: Characterisation, Microstructure, Industrial Materials, X_Ray Diffraction, Methods
University: The University of Burdwan
Completed Date: 2005
Abstract: Abstract not available newline newline
Pagination: vi, 237p.
URI: http://hdl.handle.net/10603/63944
Appears in Departments:Department of Physics

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01_title.pdfAttached File24.45 kBAdobe PDFView/Open
02_certificate.pdf41.72 kBAdobe PDFView/Open
03_preface.pdf67.43 kBAdobe PDFView/Open
04_acknowledgements.pdf34.16 kBAdobe PDFView/Open
05_list of publications.pdf34.92 kBAdobe PDFView/Open
06_contents.pdf160.83 kBAdobe PDFView/Open
07_part i.pdf4.45 MBAdobe PDFView/Open
08_part ii.pdf8.08 MBAdobe PDFView/Open
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