Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/601895
Title: Signal integrity assessment of through package multibit vias in glass interposers for 3d integration
Researcher: Kumar, Ajay
Guide(s): Prakash, Jai
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: National Institute of Technology Hamirpur
Completed Date: 2024
Abstract: newline
Pagination: xxvi, 128
URI: http://hdl.handle.net/10603/601895
Appears in Departments:Department of Electronics and Communication Engineering

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01_title.pdfAttached File217.71 kBAdobe PDFView/Open
02_prelim pages.pdf7.25 MBAdobe PDFView/Open
03_content.pdf234.57 kBAdobe PDFView/Open
04_abstract.pdf193 kBAdobe PDFView/Open
05_chapter 1.pdf1.48 MBAdobe PDFView/Open
06_chapter 2.pdf2.53 MBAdobe PDFView/Open
07_chapter 3.pdf3.3 MBAdobe PDFView/Open
08_chapter 4.pdf1.86 MBAdobe PDFView/Open
09_chapter 5.pdf3.9 MBAdobe PDFView/Open
10_chapter 6.pdf302.38 kBAdobe PDFView/Open
11_annexures.pdf328.17 kBAdobe PDFView/Open
80_recommendation.pdf4.55 MBAdobe PDFView/Open
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