Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/6002
Title: Characterization of CdS based multilayer thin films useful for photovoltaic device fabrication using different techniques with emphasis on ellipsometry
Researcher: Mathew, Sunny
Guide(s): Vijayakumar K P
Keywords: Physics
Ellipsometry
Thin films
Bilayer thin films
Upload Date: 28-Dec-2012
University: Cochin University of Science and Technology
Completed Date: 28/06/1994
Abstract: None
Pagination: 222p.
URI: http://hdl.handle.net/10603/6002
Appears in Departments:Department of Physics

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01_title.pdfAttached File14.49 kBAdobe PDFView/Open
02_certificate.pdf124.48 kBAdobe PDFView/Open
03_preface.pdf118.8 kBAdobe PDFView/Open
04_contents.pdf32.57 kBAdobe PDFView/Open
05_chapter 1.pdf728.11 kBAdobe PDFView/Open
06_chapter 2.pdf544.15 kBAdobe PDFView/Open
07_chapter 3.pdf1.87 MBAdobe PDFView/Open
08_chapter 4.pdf788.76 kBAdobe PDFView/Open
09_chapter 5.pdf467.07 kBAdobe PDFView/Open
10_chapter 6.pdf329.9 kBAdobe PDFView/Open
11_chapter 7.pdf5.08 MBAdobe PDFView/Open
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