Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/592603
Title: | Certain investigations on test data reduction using run length coding in benchmark circuits |
Researcher: | Thilagavathi P |
Guide(s): | Karthikeyan S |
Keywords: | Automatic Test Equipment Intellectual Property System-on-Chip |
University: | Anna University |
Completed Date: | 2024 |
Pagination: | xvii,138p. |
URI: | http://hdl.handle.net/10603/592603 |
Appears in Departments: | Faculty of Information and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 253.53 kB | Adobe PDF | View/Open |
02_prelim_pages.pdf | 3.25 MB | Adobe PDF | View/Open | |
03_contents.pdf | 414.84 kB | Adobe PDF | View/Open | |
04_abstracts.pdf | 9.75 kB | Adobe PDF | View/Open | |
05_chapter1.pdf | 180.85 kB | Adobe PDF | View/Open | |
06_chapter2.pdf | 240.41 kB | Adobe PDF | View/Open | |
07_chapter3.pdf | 2.22 MB | Adobe PDF | View/Open | |
08_chapter4.pdf | 1.22 MB | Adobe PDF | View/Open | |
09_chapter5.pdf | 1.58 MB | Adobe PDF | View/Open | |
10_chapter6.pdf | 3.37 MB | Adobe PDF | View/Open | |
11_annexures.pdf | 113.13 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 525.51 kB | Adobe PDF | View/Open |
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