Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/592603
Title: Certain investigations on test data reduction using run length coding in benchmark circuits
Researcher: Thilagavathi P
Guide(s): Karthikeyan S
Keywords: Automatic Test Equipment
Intellectual Property
System-on-Chip
University: Anna University
Completed Date: 2024
Pagination: xvii,138p.
URI: http://hdl.handle.net/10603/592603
Appears in Departments:Faculty of Information and Communication Engineering

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01_title.pdfAttached File253.53 kBAdobe PDFView/Open
02_prelim_pages.pdf3.25 MBAdobe PDFView/Open
03_contents.pdf414.84 kBAdobe PDFView/Open
04_abstracts.pdf9.75 kBAdobe PDFView/Open
05_chapter1.pdf180.85 kBAdobe PDFView/Open
06_chapter2.pdf240.41 kBAdobe PDFView/Open
07_chapter3.pdf2.22 MBAdobe PDFView/Open
08_chapter4.pdf1.22 MBAdobe PDFView/Open
09_chapter5.pdf1.58 MBAdobe PDFView/Open
10_chapter6.pdf3.37 MBAdobe PDFView/Open
11_annexures.pdf113.13 kBAdobe PDFView/Open
80_recommendation.pdf525.51 kBAdobe PDFView/Open
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