1. Shodhganga@INFLIBNET
  2. Anna University
  3. Faculty of Information and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/592603
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DC FieldValueLanguage
dc.coverage.spatialCertain investigations on test data reduction using run length coding in benchmark circuits
dc.date.accessioned2024-09-30T06:22:19Z-
dc.date.available2024-09-30T06:22:19Z-
dc.identifier.urihttp://hdl.handle.net/10603/592603-
dc.format.extentxvii,138p.
dc.languageEnglish
dc.relationp.126-137
dc.rightsuniversity
dc.titleCertain investigations on test data reduction using run length coding in benchmark circuits
dc.title.alternative
dc.creator.researcherThilagavathi P
dc.subject.keywordAutomatic Test Equipment
dc.subject.keywordIntellectual Property
dc.subject.keywordSystem-on-Chip
dc.description.note
dc.contributor.guideKarthikeyan S
dc.publisher.placeChennai
dc.publisher.universityAnna University
dc.publisher.institutionFaculty of Information and Communication Engineering
dc.date.registered
dc.date.completed2024
dc.date.awarded2024
dc.format.dimensions21cm
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Faculty of Information and Communication Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File253.53 kBAdobe PDFView/Open
02_prelim_pages.pdf3.25 MBAdobe PDFView/Open
03_contents.pdf414.84 kBAdobe PDFView/Open
04_abstracts.pdf9.75 kBAdobe PDFView/Open
05_chapter1.pdf180.85 kBAdobe PDFView/Open
06_chapter2.pdf240.41 kBAdobe PDFView/Open
07_chapter3.pdf2.22 MBAdobe PDFView/Open
08_chapter4.pdf1.22 MBAdobe PDFView/Open
09_chapter5.pdf1.58 MBAdobe PDFView/Open
10_chapter6.pdf3.37 MBAdobe PDFView/Open
11_annexures.pdf113.13 kBAdobe PDFView/Open
80_recommendation.pdf525.51 kBAdobe PDFView/Open
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