Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/587663
Title: | Investigations on some opto electronic techniques for dimensional metrology |
Researcher: | Chaudhary, Krishan Pal |
Guide(s): | Chandra Shakher and Tanwar, L.S. |
Keywords: | Physical Sciences Physics Physics Atomic Molecular and Chemical |
University: | Indian Institute of Technology Delhi |
Completed Date: | 2005 |
Abstract: | Abstract Available |
Pagination: | NA |
URI: | http://hdl.handle.net/10603/587663 |
Appears in Departments: | Centre for Sensors, Instrumentation and Cyber Physical System Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 20.63 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 165.27 kB | Adobe PDF | View/Open | |
03_content.pdf | 72.46 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 74.13 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 962 kB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 18.71 MB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 19.74 MB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 4.87 MB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 4.27 MB | Adobe PDF | View/Open | |
10_chapter 6.pdf | 17.27 MB | Adobe PDF | View/Open | |
11_annexures.pdf | 1.35 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 17.29 MB | Adobe PDF | View/Open |
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