Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/587663
Title: Investigations on some opto electronic techniques for dimensional metrology
Researcher: Chaudhary, Krishan Pal
Guide(s): Chandra Shakher and Tanwar, L.S.
Keywords: Physical Sciences
Physics
Physics Atomic Molecular and Chemical
University: Indian Institute of Technology Delhi
Completed Date: 2005
Abstract: Abstract Available
Pagination: NA
URI: http://hdl.handle.net/10603/587663
Appears in Departments:Centre for Sensors, Instrumentation and Cyber Physical System Engineering

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01_title.pdfAttached File20.63 kBAdobe PDFView/Open
02_prelim pages.pdf165.27 kBAdobe PDFView/Open
03_content.pdf72.46 kBAdobe PDFView/Open
04_abstract.pdf74.13 kBAdobe PDFView/Open
05_chapter 1.pdf962 kBAdobe PDFView/Open
06_chapter 2.pdf18.71 MBAdobe PDFView/Open
07_chapter 3.pdf19.74 MBAdobe PDFView/Open
08_chapter 4.pdf4.87 MBAdobe PDFView/Open
09_chapter 5.pdf4.27 MBAdobe PDFView/Open
10_chapter 6.pdf17.27 MBAdobe PDFView/Open
11_annexures.pdf1.35 MBAdobe PDFView/Open
80_recommendation.pdf17.29 MBAdobe PDFView/Open
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