Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/583431
Title: Ion Beam Induced Defect Phenomena in Rock Salt Crystals MgO NiO for Optical and Electronic Device Applications
Researcher: Sourav Bhakta
Guide(s): Pratap Kumar Sahoo
Keywords: Physical Sciences
Physics
University: Homi Bhabha National Institute
Completed Date: 2024
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/583431
Appears in Departments:Department of Physical Sciences

Files in This Item:
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01_title.pdfAttached File162.16 kBAdobe PDFView/Open
02_prelim_pages.pdf4 MBAdobe PDFView/Open
03_content.pdf108.43 kBAdobe PDFView/Open
04_abstract.pdf133.86 kBAdobe PDFView/Open
05_chapter_1.pdf1.59 MBAdobe PDFView/Open
06_chapter_2.pdf2.75 MBAdobe PDFView/Open
07_chapter_3.pdf5.6 MBAdobe PDFView/Open
08_chapter_4.pdf7.11 MBAdobe PDFView/Open
09_chapter_5.pdf3.57 MBAdobe PDFView/Open
10_annexures.pdf757.22 kBAdobe PDFView/Open
11_chapter_6.pdf7.5 MBAdobe PDFView/Open
12_chapter_7.pdf8.46 MBAdobe PDFView/Open
13_chapter_8.pdf133.86 kBAdobe PDFView/Open
18_certificate.pdf88.53 kBAdobe PDFView/Open
19_list_of_graph_and_table.pdf573.52 kBAdobe PDFView/Open
20_other_info_compressed.pdf21.57 MBAdobe PDFView/Open
80_recommendation.pdf162.16 kBAdobe PDFView/Open
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