Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/571725
Title: | Analysis of the effect of defects in aigan |
Researcher: | Kaushik, Janesh Kumar |
Guide(s): | Panwar, B.S. and Balakrishnan, V.R. |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Indian Institute of Technology Delhi |
Completed Date: | 2015 |
Abstract: | Abstract Available newline newline |
Pagination: | NA |
URI: | http://hdl.handle.net/10603/571725 |
Appears in Departments: | Centre for Applied Research in Electronics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 164 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 102.62 kB | Adobe PDF | View/Open | |
03_content.pdf | 22.41 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 10.92 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 1.27 MB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 222.85 kB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 430.54 kB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 696.08 kB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 419.95 kB | Adobe PDF | View/Open | |
10_chapter 6.pdf | 293.09 kB | Adobe PDF | View/Open | |
11_chapter 7.pdf | 129.9 kB | Adobe PDF | View/Open | |
12_annexures.pdf | 103.6 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 293.49 kB | Adobe PDF | View/Open |
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