Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/571725
Title: Analysis of the effect of defects in aigan
Researcher: Kaushik, Janesh Kumar
Guide(s): Panwar, B.S. and Balakrishnan, V.R.
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Delhi
Completed Date: 2015
Abstract: Abstract Available newline newline
Pagination: NA
URI: http://hdl.handle.net/10603/571725
Appears in Departments:Centre for Applied Research in Electronics

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01_title.pdfAttached File164 kBAdobe PDFView/Open
02_prelim pages.pdf102.62 kBAdobe PDFView/Open
03_content.pdf22.41 kBAdobe PDFView/Open
04_abstract.pdf10.92 kBAdobe PDFView/Open
05_chapter 1.pdf1.27 MBAdobe PDFView/Open
06_chapter 2.pdf222.85 kBAdobe PDFView/Open
07_chapter 3.pdf430.54 kBAdobe PDFView/Open
08_chapter 4.pdf696.08 kBAdobe PDFView/Open
09_chapter 5.pdf419.95 kBAdobe PDFView/Open
10_chapter 6.pdf293.09 kBAdobe PDFView/Open
11_chapter 7.pdf129.9 kBAdobe PDFView/Open
12_annexures.pdf103.6 kBAdobe PDFView/Open
80_recommendation.pdf293.49 kBAdobe PDFView/Open
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