1. Shodhganga@INFLIBNET
  2. Rajiv Gandhi Proudyogiki Vishwavidyalaya
  3. Department of Electronic & Communication
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/569152
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2024-06-04T11:53:34Z-
dc.date.available2024-06-04T11:53:34Z-
dc.identifier.urihttp://hdl.handle.net/10603/569152-
dc.description.abstractnewline
dc.format.extent36.02MB
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleReliability assesment and enhancement of electronic devices and systems
dc.title.alternative
dc.creator.researcherThakur, Yatindra Singh
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.description.note
dc.contributor.guideSakravdia , D. K.
dc.publisher.placeBhopal
dc.publisher.universityRajiv Gandhi Proudyogiki Vishwavidyalaya
dc.publisher.institutionDepartment of Electronic and Communication
dc.date.registered2012
dc.date.completed2021
dc.date.awarded2021
dc.format.dimensionsA4
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronic & Communication

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File3.24 MBAdobe PDFView/Open
02_prelim pages.pdf888.15 kBAdobe PDFView/Open
03_contents.pdf3.24 MBAdobe PDFView/Open
04_abstract.pdf3.24 MBAdobe PDFView/Open
05_chapter1.pdf3.18 MBAdobe PDFView/Open
06_chapter2.pdf3.18 MBAdobe PDFView/Open
07_chapter3.pdf3.18 MBAdobe PDFView/Open
08_chapter4.pdf3.18 MBAdobe PDFView/Open
09_chapter5.pdf3.18 MBAdobe PDFView/Open
10_annexures.pdf1.11 MBAdobe PDFView/Open
11_chapter6.pdf3.18 MBAdobe PDFView/Open
80_recommendation.pdf3.18 MBAdobe PDFView/Open
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