Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/569152
Title: Reliability assesment and enhancement of electronic devices and systems
Researcher: Thakur, Yatindra Singh
Guide(s): Sakravdia , D. K.
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Rajiv Gandhi Proudyogiki Vishwavidyalaya
Completed Date: 2021
Abstract: newline
Pagination: 36.02MB
URI: http://hdl.handle.net/10603/569152
Appears in Departments:Department of Electronic & Communication

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File3.24 MBAdobe PDFView/Open
02_prelim pages.pdf888.15 kBAdobe PDFView/Open
03_contents.pdf3.24 MBAdobe PDFView/Open
04_abstract.pdf3.24 MBAdobe PDFView/Open
05_chapter1.pdf3.18 MBAdobe PDFView/Open
06_chapter2.pdf3.18 MBAdobe PDFView/Open
07_chapter3.pdf3.18 MBAdobe PDFView/Open
08_chapter4.pdf3.18 MBAdobe PDFView/Open
09_chapter5.pdf3.18 MBAdobe PDFView/Open
10_annexures.pdf1.11 MBAdobe PDFView/Open
11_chapter6.pdf3.18 MBAdobe PDFView/Open
80_recommendation.pdf3.18 MBAdobe PDFView/Open
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