Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/569152
Title: | Reliability assesment and enhancement of electronic devices and systems |
Researcher: | Thakur, Yatindra Singh |
Guide(s): | Sakravdia , D. K. |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Rajiv Gandhi Proudyogiki Vishwavidyalaya |
Completed Date: | 2021 |
Abstract: | newline |
Pagination: | 36.02MB |
URI: | http://hdl.handle.net/10603/569152 |
Appears in Departments: | Department of Electronic & Communication |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 3.24 MB | Adobe PDF | View/Open |
02_prelim pages.pdf | 888.15 kB | Adobe PDF | View/Open | |
03_contents.pdf | 3.24 MB | Adobe PDF | View/Open | |
04_abstract.pdf | 3.24 MB | Adobe PDF | View/Open | |
05_chapter1.pdf | 3.18 MB | Adobe PDF | View/Open | |
06_chapter2.pdf | 3.18 MB | Adobe PDF | View/Open | |
07_chapter3.pdf | 3.18 MB | Adobe PDF | View/Open | |
08_chapter4.pdf | 3.18 MB | Adobe PDF | View/Open | |
09_chapter5.pdf | 3.18 MB | Adobe PDF | View/Open | |
10_annexures.pdf | 1.11 MB | Adobe PDF | View/Open | |
11_chapter6.pdf | 3.18 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 3.18 MB | Adobe PDF | View/Open |
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