1. Shodhganga@INFLIBNET
  2. Andhra University
  3. Department of Physics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/567430
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2024-05-29T05:21:03Z-
dc.date.available2024-05-29T05:21:03Z-
dc.identifier.urihttp://hdl.handle.net/10603/567430-
dc.description.abstractNew Line newline
dc.format.extent172 Pg
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleEllipsometric Study of Contaminant Films on Thinfilm Substrates and The Effect of Various Stages of Cleaning
dc.title.alternative
dc.creator.researcherVara Prasad P L H
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.description.note
dc.contributor.guideJ. Ashok
dc.publisher.placeVishakhapatnam
dc.publisher.universityAndhra University
dc.publisher.institutionDepartment of Physics
dc.date.registered
dc.date.completed1982
dc.date.awarded1982
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File56.52 kBAdobe PDFView/Open
02_prelim pages.pdf1.69 MBAdobe PDFView/Open
03_contents.pdf141.66 kBAdobe PDFView/Open
04_chapter 1.pdf3.88 MBAdobe PDFView/Open
05_chapter 2.pdf5.3 MBAdobe PDFView/Open
06_chapter 3.pdf14.33 MBAdobe PDFView/Open
07_chapter 4.pdf12.77 MBAdobe PDFView/Open
08_chapter 5.pdf9.75 MBAdobe PDFView/Open
09_annexures.pdf6.12 MBAdobe PDFView/Open
80_recommendation.pdf9.81 MBAdobe PDFView/Open
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