Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/567430
Title: | Ellipsometric Study of Contaminant Films on Thinfilm Substrates and The Effect of Various Stages of Cleaning |
Researcher: | Vara Prasad P L H |
Guide(s): | J. Ashok |
Keywords: | Physical Sciences Physics Physics Applied |
University: | Andhra University |
Completed Date: | 1982 |
Abstract: | New Line newline |
Pagination: | 172 Pg |
URI: | http://hdl.handle.net/10603/567430 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 56.52 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 1.69 MB | Adobe PDF | View/Open | |
03_contents.pdf | 141.66 kB | Adobe PDF | View/Open | |
04_chapter 1.pdf | 3.88 MB | Adobe PDF | View/Open | |
05_chapter 2.pdf | 5.3 MB | Adobe PDF | View/Open | |
06_chapter 3.pdf | 14.33 MB | Adobe PDF | View/Open | |
07_chapter 4.pdf | 12.77 MB | Adobe PDF | View/Open | |
08_chapter 5.pdf | 9.75 MB | Adobe PDF | View/Open | |
09_annexures.pdf | 6.12 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 9.81 MB | Adobe PDF | View/Open |
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