Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/567430
Title: Ellipsometric Study of Contaminant Films on Thinfilm Substrates and The Effect of Various Stages of Cleaning
Researcher: Vara Prasad P L H
Guide(s): J. Ashok
Keywords: Physical Sciences
Physics
Physics Applied
University: Andhra University
Completed Date: 1982
Abstract: New Line newline
Pagination: 172 Pg
URI: http://hdl.handle.net/10603/567430
Appears in Departments:Department of Physics

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01_title.pdfAttached File56.52 kBAdobe PDFView/Open
02_prelim pages.pdf1.69 MBAdobe PDFView/Open
03_contents.pdf141.66 kBAdobe PDFView/Open
04_chapter 1.pdf3.88 MBAdobe PDFView/Open
05_chapter 2.pdf5.3 MBAdobe PDFView/Open
06_chapter 3.pdf14.33 MBAdobe PDFView/Open
07_chapter 4.pdf12.77 MBAdobe PDFView/Open
08_chapter 5.pdf9.75 MBAdobe PDFView/Open
09_annexures.pdf6.12 MBAdobe PDFView/Open
80_recommendation.pdf9.81 MBAdobe PDFView/Open
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