Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/562573
Title: Low power excitation source based set up for thermal imaging defect detection
Researcher: Roy, Deboshree
Guide(s): Tuli, Suneet and Babu, Prabhu
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Delhi
Completed Date: 2018
Abstract: Abstract Available newline newline
Pagination: NA
URI: http://hdl.handle.net/10603/562573
Appears in Departments:Centre for Applied Research in Electronics

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01_title.pdfAttached File301.42 kBAdobe PDFView/Open
02_prelim pages.pdf132.93 kBAdobe PDFView/Open
03_content.pdf87.1 kBAdobe PDFView/Open
04_abstract.pdf208.32 kBAdobe PDFView/Open
05_chapter 1.pdf510.9 kBAdobe PDFView/Open
06_chapter 2.pdf4.5 MBAdobe PDFView/Open
07_chapter 3.pdf2.74 MBAdobe PDFView/Open
08_chapter 4.pdf4.3 MBAdobe PDFView/Open
09_chapter 5.pdf3.01 MBAdobe PDFView/Open
10_chapter 6.pdf111.32 kBAdobe PDFView/Open
11_annexures.pdf3.02 MBAdobe PDFView/Open
80_recommendation.pdf994.38 kBAdobe PDFView/Open
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