1. Shodhganga@INFLIBNET
  2. Nims University Rajasthan
  3. Department of Electronics and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/547265
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2024-02-26T06:36:33Z-
dc.date.available2024-02-26T06:36:33Z-
dc.identifier.urihttp://hdl.handle.net/10603/547265-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleAnalysis of stochastic behaviour of some reliability models in electronics engineering
dc.title.alternative
dc.creator.researcherPankaj Singh
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.description.note
dc.contributor.guideAbhishek Srivastava
dc.publisher.placeJaipur
dc.publisher.universityNims University Rajasthan
dc.publisher.institutionDepartment of Electronics and Communication Engineering
dc.date.registered
dc.date.completed2016
dc.date.awarded2016
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronics and Communication Engineering

Files in This Item:
File Description SizeFormat 
80_recommendation.pdfAttached File203.51 kBAdobe PDFView/Open
abstract.pdf210.74 kBAdobe PDFView/Open
annexures.pdf372 kBAdobe PDFView/Open
chapter-2.pdf475.11 kBAdobe PDFView/Open
chapter-3.pdf153.5 kBAdobe PDFView/Open
chapter-4.pdf1.11 MBAdobe PDFView/Open
chapter-5.pdf111.26 kBAdobe PDFView/Open
contents.pdf339.05 kBAdobe PDFView/Open
prelim.pdf540.09 kBAdobe PDFView/Open
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