Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/547265
Title: | Analysis of stochastic behaviour of some reliability models in electronics engineering |
Researcher: | Pankaj Singh |
Guide(s): | Abhishek Srivastava |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Nims University Rajasthan |
Completed Date: | 2016 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/547265 |
Appears in Departments: | Department of Electronics and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
80_recommendation.pdf | Attached File | 203.51 kB | Adobe PDF | View/Open |
abstract.pdf | 210.74 kB | Adobe PDF | View/Open | |
annexures.pdf | 372 kB | Adobe PDF | View/Open | |
chapter-2.pdf | 475.11 kB | Adobe PDF | View/Open | |
chapter-3.pdf | 153.5 kB | Adobe PDF | View/Open | |
chapter-4.pdf | 1.11 MB | Adobe PDF | View/Open | |
chapter-5.pdf | 111.26 kB | Adobe PDF | View/Open | |
contents.pdf | 339.05 kB | Adobe PDF | View/Open | |
prelim.pdf | 540.09 kB | Adobe PDF | View/Open |
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