Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/547265
Title: Analysis of stochastic behaviour of some reliability models in electronics engineering
Researcher: Pankaj Singh
Guide(s): Abhishek Srivastava
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Nims University Rajasthan
Completed Date: 2016
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/547265
Appears in Departments:Department of Electronics and Communication Engineering

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80_recommendation.pdfAttached File203.51 kBAdobe PDFView/Open
abstract.pdf210.74 kBAdobe PDFView/Open
annexures.pdf372 kBAdobe PDFView/Open
chapter-2.pdf475.11 kBAdobe PDFView/Open
chapter-3.pdf153.5 kBAdobe PDFView/Open
chapter-4.pdf1.11 MBAdobe PDFView/Open
chapter-5.pdf111.26 kBAdobe PDFView/Open
contents.pdf339.05 kBAdobe PDFView/Open
prelim.pdf540.09 kBAdobe PDFView/Open
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