Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/544390
Title: Analysis of ferroelectric gate stack induced steep switching and negative differential resistance in mosfet for ultra low power applications
Researcher: Semwal, Sandeep
Guide(s): Kranti, Abhinav
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Indore
Completed Date: 2023
Abstract: Available newline newline
Pagination: xxxviii, 207p.
URI: http://hdl.handle.net/10603/544390
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File71.15 kBAdobe PDFView/Open
02_prelim pages.pdf681.98 kBAdobe PDFView/Open
03_contents.pdf104.93 kBAdobe PDFView/Open
04_abstract.pdf223.77 kBAdobe PDFView/Open
05_chapter 1.pdf1.2 MBAdobe PDFView/Open
06_chapter 2.pdf1.03 MBAdobe PDFView/Open
07_chapter 3.pdf1.65 MBAdobe PDFView/Open
08_chapter 4.pdf1.7 MBAdobe PDFView/Open
09_annexures files.pdf258.78 kBAdobe PDFView/Open
80_recommendation.pdf378.7 kBAdobe PDFView/Open
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