Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/543110
Title: Simulation and Modelling of High Power and High Frequency FINFET s for RFIC Application
Researcher: Nomitha Reddy, Mandem
Guide(s): Panda, Deepak Kumar
Keywords: Analytical Model
BFOM
DIBL
University: Vellore Institute of Technology (VIT-AP)
Completed Date: 2023
Abstract: In this thesis we have provided a complete comprehensive analysis about the High power newlineand High frequency FINFET s for RFIC applications. The revolutions made in the CMOS technology are brought up by, continuous downscaling in order to obtain higher density, better performance and low power consumption, causing deleterious Short Channel Effects. Planar MOSFET s have faced very hard challenges in the nanometer space, when ever the channel length happens to be in the same order of magnitude like the depletion-layer widths of drain and the source junctions. Hence, the channel length of the MOSFET s should be great enough newlinewhen compared to the sum of drain and source depletion widths in order to eradicate edge newlineeffects. Orelse numerous effects would occur. In MOSFET s as channel Length diminishes newlinethe gate loose s its control on the channel, as it isn t good from power consumption point of view. MOSFET s cannot control leakage path, removing leakage current is a path for im-provising electrostatic control. A way of achieving it can be done by using a structure with multiple-gates as they allow the scaling of a transistor beyond the MOSFET scaling limit. newlineIn this case, the leakage current happens to be in the channel centre and reducing the chan-nel decreases the current. Hence SOI and FINFET structures are used in order to achieve high gate-to-channel capacitance and decreases drain-to-channel capacitance. Another way of improvising the computational power can be done through changing the materials employed during manufacturing. In short, FINFET devices display superior SCE s behaviour have con-siderably lower switching times, and higher current density than MOSFET technology. We have discussed briefly about the history of FINFET s. The review has been done on the various structures for performance escalation materials for FINFET structure performance Escalation newlineas well as the various applications in which FINFET s are used along with the various ap- newlineplications in which FINFET are used, various parameters used to per
Pagination: xv,128
URI: http://hdl.handle.net/10603/543110
Appears in Departments:Department of Electronics Engineering

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02-prelim pages.pdf268.06 kBAdobe PDFView/Open
03- contents.pdf45.3 kBAdobe PDFView/Open
04-abstract.pdf109.56 kBAdobe PDFView/Open
05-chapter1.pdf1.12 MBAdobe PDFView/Open
06-chapter2.pdf1.33 MBAdobe PDFView/Open
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references.pdf120.99 kBAdobe PDFView/Open
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