1. Shodhganga@INFLIBNET
  2. Jaypee Institute of Information Technology
  3. Department of Computer Science Engineering and Information Technology
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/541551
Title: Software Metric Based Efficient Approaches for Cross-Project Defect Prediction
Researcher: Khatri, Yogita
Guide(s): Singh, Sandeep Kumar
Keywords: Computer Science
Computer Science Information Systems
Cross-Project Defect Prediction,
Effort Aware Evaluation Measures,
Engineering and Technology
Feature Selection,
Machine Learning
Software Defect Prediction,
Software Metric
Transfer Boosting
University: Jaypee Institute of Information Technology
Completed Date: 2023
Abstract: included newline
Pagination: xvii, 159p. Synopsis-24
URI: http://hdl.handle.net/10603/541551
Appears in Departments:Department of Computer Science Engineering and Information Technology

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File89.91 kBAdobe PDFView/Open
02_prelim pages.pdf269.61 kBAdobe PDFView/Open
03_table of contents.pdf158.12 kBAdobe PDFView/Open
04_abstract.pdf80.07 kBAdobe PDFView/Open
05_chapter1.pdf345.71 kBAdobe PDFView/Open
06_chapter2.pdf526.52 kBAdobe PDFView/Open
07_chapter3.pdf1.13 MBAdobe PDFView/Open
08_chapter4.pdf1.01 MBAdobe PDFView/Open
09_chapter5.pdf1.19 MBAdobe PDFView/Open
10_chapter6.pdf757.97 kBAdobe PDFView/Open
11_references.pdf266.89 kBAdobe PDFView/Open
12_list of publications.pdf197.44 kBAdobe PDFView/Open
13_synopsis.pdf493.53 kBAdobe PDFView/Open
80_recommendation.pdf325.98 kBAdobe PDFView/Open
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