1. Shodhganga@INFLIBNET
  2. University of Mumbai
  3. Department of Physics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/534662
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2023-12-29T07:19:25Z-
dc.date.available2023-12-29T07:19:25Z-
dc.identifier.urihttp://hdl.handle.net/10603/534662-
dc.description.abstractnewlineNo newline
dc.format.extentxii, 195p
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleStudy of structural defects and electrical properties of crystalline silicon layer implanted with iron ions
dc.title.alternative
dc.creator.researcherThailamani, L E
dc.subject.keywordCrystalline Silicon
dc.subject.keywordElectrical Properties
dc.subject.keywordIron Ions
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.subject.keywordPKA
dc.subject.keywordStructural Defects
dc.description.note
dc.contributor.guideJoshi, M C
dc.publisher.placeMumbai
dc.publisher.universityUniversity of Mumbai
dc.publisher.institutionDepartment of Physics
dc.date.registered
dc.date.completed1981
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
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01_title.pdfAttached File129.48 kBAdobe PDFView/Open
02_prelim pages.pdf669.33 kBAdobe PDFView/Open
03_contents.pdf808.05 kBAdobe PDFView/Open
04_chapter 1.pdf7.09 MBAdobe PDFView/Open
05_chapter 2.pdf5.59 MBAdobe PDFView/Open
06_chapter 3.pdf6.04 MBAdobe PDFView/Open
07_chapter 4.pdf8.49 MBAdobe PDFView/Open
08_chapter 5.pdf2.8 MBAdobe PDFView/Open
80_recommendation.pdf2.93 MBAdobe PDFView/Open
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