Shodhganga : a reservoir of Indian theses @ INFLIBNET
The Shodhganga@INFLIBNET Centre provides a platform for research students to deposit their Ph.D. theses and make it available to the entire scholarly community in open access.
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/534662
| Title: | Study of structural defects and electrical properties of crystalline silicon layer implanted with iron ions |
| Researcher: | Thailamani, L E |
| Guide(s): | Joshi, M C |
| Keywords: | Crystalline Silicon Electrical Properties Iron Ions Physical Sciences Physics Physics Applied PKA Structural Defects |
| University: | University of Mumbai |
| Completed Date: | 1981 |
| Abstract: | newlineNo newline |
| Pagination: | xii, 195p |
| URI: | http://hdl.handle.net/10603/534662 |
| Appears in Departments: | Department of Physics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 01_title.pdf | Attached File | 129.48 kB | Adobe PDF | View/Open |
| 02_prelim pages.pdf | 669.33 kB | Adobe PDF | View/Open | |
| 03_contents.pdf | 808.05 kB | Adobe PDF | View/Open | |
| 04_chapter 1.pdf | 7.09 MB | Adobe PDF | View/Open | |
| 05_chapter 2.pdf | 5.59 MB | Adobe PDF | View/Open | |
| 06_chapter 3.pdf | 6.04 MB | Adobe PDF | View/Open | |
| 07_chapter 4.pdf | 8.49 MB | Adobe PDF | View/Open | |
| 08_chapter 5.pdf | 2.8 MB | Adobe PDF | View/Open | |
| 80_recommendation.pdf | 2.93 MB | Adobe PDF | View/Open |
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