Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/531138
Title: Development of Multiferroic and other Materials for Electronic Devices
Researcher: Bhadala, Falguni
Guide(s): Roy, Maheshwar
Keywords: Physical Sciences
Physics
Physics Applied
X-ray diffraction, Rietveld refinement, Perovskite, Multiferroic, Dielectric constant, Dielectric loss, Conductivity, UV-VIS Spectroscopy, FTIR Spectroscopy, Raman Spectroscopy
University: Mohan Lal Sukhadia University
Completed Date: 2022
Abstract: newlineAbstract Available
Pagination: 332
URI: http://hdl.handle.net/10603/531138
Appears in Departments:Department of Physics

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certificate.pdf82.21 kBAdobe PDFView/Open
chapter 1.pdf1.16 MBAdobe PDFView/Open
chapter 2.pdf1.11 MBAdobe PDFView/Open
chapter 3.pdf6.05 MBAdobe PDFView/Open
chapter 4.pdf9.02 MBAdobe PDFView/Open
chapter 5.pdf2.31 MBAdobe PDFView/Open
chapter 6.pdf4.02 MBAdobe PDFView/Open
preliminary_pages.pdf941.33 kBAdobe PDFView/Open
publication.pdf.pdf163.08 kBAdobe PDFView/Open
title.pdf59.27 kBAdobe PDFView/Open
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