Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/529049
Title: Electron Microscopy of Interfaces in Au CU multilayer on Si Li Ni Mn x Oy on Nb doped SrTiO3 and Nano composite steel
Researcher: Singh, Ankit
Guide(s): Mandal, R.K and Basu, Joysurya
Keywords: Engineering
Engineering and Technology
Metallurgy and Metallurgical Engineering
University: Indian Institute of Technology IIT (BHU), Varanasi
Completed Date: 2022
Abstract: Abstract is available in attachments newline
Pagination: 
URI: http://hdl.handle.net/10603/529049
Appears in Departments:Metallurgical Engineering

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01_title page.pdfAttached File103.64 kBAdobe PDFView/Open
02_prelims pages.pdf9.07 MBAdobe PDFView/Open
03_contents.pdf1.06 MBAdobe PDFView/Open
04_abstract.pdf1.47 MBAdobe PDFView/Open
05_chapter 01.pdf10.21 MBAdobe PDFView/Open
06_chapter 02.pdf5.92 MBAdobe PDFView/Open
07_chapter 03.pdf15.88 MBAdobe PDFView/Open
08_chapter 04.pdf4.6 MBAdobe PDFView/Open
09_chapter 05.pdf14.09 MBAdobe PDFView/Open
10_chapter 06.pdf16.93 MBAdobe PDFView/Open
11_chapter 07.pdf924.93 kBAdobe PDFView/Open
12_annexures.pdf11.87 MBAdobe PDFView/Open
80_recommendation.pdf1.03 MBAdobe PDFView/Open
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