Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/521948
Title: Modeling and Simulation of Nano Materials For VLSI Interconnects
Researcher: Kundu, Arun
Guide(s): Manoj Kumar
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: OM Sterling Global University
Completed Date: 2022
Abstract: In this work, the unique atomic properties and structure of carbon nanotube (CNT) are newlinediscussed. The electronic band structure, small size and dimension are major newlinecontributor for unique mechanical, thermal and electrical properties. Our thesis newlinesummarizes electronic band structure of 1D CNTs, transport properties and their newlineapplications. In addition to this, a briefing of the production and purification of CNTs is newlinealso presented. newlineModeling of CNT interconnects is primarily dependent on diameter, chiralities, electron newlinetransport properties, metallic and semiconducting properties. Our work technically newlinereviews analytical models of single-walled (SWNT), double-walled (DWNT), and newlinemulti-walled CNT (MWNT) structures. Depending on geometry, equivalent electric newlinemodel and associated resistive, inductive, and capacitive parasitics for different SWNT, newlineDWNT, and MWNT bundles are described. newline newline
Pagination: 215,
URI: http://hdl.handle.net/10603/521948
Appears in Departments:Electronics Engineering

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01_title.pdfAttached File332.97 kBAdobe PDFView/Open
02_preliminary pages.pdf227.02 kBAdobe PDFView/Open
03_table of contents.pdf186.41 kBAdobe PDFView/Open
04_abstract.pdf14.54 kBAdobe PDFView/Open
05_chapter 1.pdf1.16 MBAdobe PDFView/Open
06_chapter 2.pdf466.45 kBAdobe PDFView/Open
07_chapter 3.pdf403.96 kBAdobe PDFView/Open
08_chapter 4.pdf247.66 kBAdobe PDFView/Open
09_chapter 5.pdf387.49 kBAdobe PDFView/Open
10_chapter 6.pdf473.99 kBAdobe PDFView/Open
11_chapter 7.pdf364.66 kBAdobe PDFView/Open
12_chapter 8.pdf216.38 kBAdobe PDFView/Open
13_bibliography.pdf447.97 kBAdobe PDFView/Open
80_recommendation.pdf189.36 kBAdobe PDFView/Open
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