1. Shodhganga@INFLIBNET
  2. Jaypee Institute of Information Technology
  3. Department of Electronics and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/517218
Title: Design and Reliability Improvement of Tunnel Field Effect Transistor
Researcher: Kwatra, Priyanka
Guide(s): Singh, Sajai Vir and Nigam, Kaushal
Keywords: Analogue/RF and linearity FOMs
Band-to-band tunnelling
Bilateral tunnelling based TFET
CMOS scaling
Dual gate oxide
Engineering
Engineering and Technology
Engineering Electrical and Electronic
Interface trap charges
Tunnel field effect transistor.
University: Jaypee Institute of Information Technology
Completed Date: 2023
Abstract: included newline
Pagination: xxxi, 189p., Synopsis-16
URI: http://hdl.handle.net/10603/517218
Appears in Departments:Department of Electronics and Communication Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File302.83 kBAdobe PDFView/Open
02_prelim pages.pdf554.13 kBAdobe PDFView/Open
03_table of contents.pdf289.55 kBAdobe PDFView/Open
04_abstract.pdf216.68 kBAdobe PDFView/Open
05_chapter1.pdf1.21 MBAdobe PDFView/Open
06_chapter2.pdf4.47 MBAdobe PDFView/Open
07_chapter3.pdf5.25 MBAdobe PDFView/Open
08_chapter4.pdf3.02 MBAdobe PDFView/Open
09_chapter5.pdf7.41 MBAdobe PDFView/Open
10_chapter6.pdf5.85 MBAdobe PDFView/Open
11_references.pdf422.21 kBAdobe PDFView/Open
12_list of publications.pdf238.42 kBAdobe PDFView/Open
13_synopsis.pdf421.22 kBAdobe PDFView/Open
80_recommendation.pdf505.67 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: