Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/517090
Title: | Power reduction methodologies for Testing low power VLSI circuits |
Researcher: | WARADE NILIMA SATISH |
Guide(s): | Ravi T |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Sathyabama Institute of Science and Technology |
Completed Date: | 2021 |
Pagination: | vi, 138 |
URI: | http://hdl.handle.net/10603/517090 |
Appears in Departments: | ELECTRONICS DEPARTMENT |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
10.chapter 6.pdf | Attached File | 131.11 kB | Adobe PDF | View/Open |
11.annexure.pdf | 1.76 MB | Adobe PDF | View/Open | |
1.title.pdf | 19.39 kB | Adobe PDF | View/Open | |
2.prelim pages.pdf | 944.33 kB | Adobe PDF | View/Open | |
3.abstract.pdf | 11.87 kB | Adobe PDF | View/Open | |
4.contents.pdf | 154.61 kB | Adobe PDF | View/Open | |
5.chapter 1.pdf | 223.21 kB | Adobe PDF | View/Open | |
6.chapter 2.pdf | 244.83 kB | Adobe PDF | View/Open | |
7.chapter 3.pdf | 1.09 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 19.39 kB | Adobe PDF | View/Open | |
8.chapter 4.pdf | 1.06 MB | Adobe PDF | View/Open | |
9.chapter 5.pdf | 1.02 MB | Adobe PDF | View/Open |
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