Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/517090
Title: Power reduction methodologies for Testing low power VLSI circuits
Researcher: WARADE NILIMA SATISH
Guide(s): Ravi T
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Sathyabama Institute of Science and Technology
Completed Date: 2021
Pagination: vi, 138
URI: http://hdl.handle.net/10603/517090
Appears in Departments:ELECTRONICS DEPARTMENT

Files in This Item:
File Description SizeFormat 
10.chapter 6.pdfAttached File131.11 kBAdobe PDFView/Open
11.annexure.pdf1.76 MBAdobe PDFView/Open
1.title.pdf19.39 kBAdobe PDFView/Open
2.prelim pages.pdf944.33 kBAdobe PDFView/Open
3.abstract.pdf11.87 kBAdobe PDFView/Open
4.contents.pdf154.61 kBAdobe PDFView/Open
5.chapter 1.pdf223.21 kBAdobe PDFView/Open
6.chapter 2.pdf244.83 kBAdobe PDFView/Open
7.chapter 3.pdf1.09 MBAdobe PDFView/Open
80_recommendation.pdf19.39 kBAdobe PDFView/Open
8.chapter 4.pdf1.06 MBAdobe PDFView/Open
9.chapter 5.pdf1.02 MBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: