Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/516162
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dc.coverage.spatial
dc.date.accessioned2023-10-05T10:53:55Z-
dc.date.available2023-10-05T10:53:55Z-
dc.identifier.urihttp://hdl.handle.net/10603/516162-
dc.description.abstractYes newline newline
dc.format.extent244p
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleDigital image processing and simulation technique for study of crystal defects in metallic materials
dc.title.alternative
dc.creator.researcherIyer, Sankaranarayanan
dc.subject.keywordCrystal Defects
dc.subject.keywordElectron Microscopy
dc.subject.keywordKinematical
dc.subject.keywordMetallic Materials
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.subject.keywordSimulation Technique
dc.description.note
dc.contributor.guideGogawale, S V
dc.publisher.placeMumbai
dc.publisher.universityUniversity of Mumbai
dc.publisher.institutionDepartment of Physics
dc.date.registered
dc.date.completed1999
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physics

Files in This Item:
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01_title.pdfAttached File248.54 kBAdobe PDFView/Open
02_prelim pages.pdf3.86 MBAdobe PDFView/Open
03_contents.pdf2.13 MBAdobe PDFView/Open
04_chapter 1.pdf6.73 MBAdobe PDFView/Open
05_chapter 2.pdf17.59 MBAdobe PDFView/Open
06_chapter 3.pdf7.15 MBAdobe PDFView/Open
07_chapter 4.pdf9.92 MBAdobe PDFView/Open
08_chapter 5.pdf10.53 MBAdobe PDFView/Open
09_chapter 6.pdf4.81 MBAdobe PDFView/Open
10_chapter 7.pdf7.16 MBAdobe PDFView/Open
11_chapter 8.pdf9.77 MBAdobe PDFView/Open
12_chapter 9.pdf3.76 MBAdobe PDFView/Open
13_annexures.pdf13.48 MBAdobe PDFView/Open
80_recommendation.pdf4.01 MBAdobe PDFView/Open


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