Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/516162
Title: | Digital image processing and simulation technique for study of crystal defects in metallic materials |
Researcher: | Iyer, Sankaranarayanan |
Guide(s): | Gogawale, S V |
Keywords: | Crystal Defects Electron Microscopy Kinematical Metallic Materials Physical Sciences Physics Physics Applied Simulation Technique |
University: | University of Mumbai |
Completed Date: | 1999 |
Abstract: | Yes newline newline |
Pagination: | 244p |
URI: | http://hdl.handle.net/10603/516162 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 248.54 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 3.86 MB | Adobe PDF | View/Open | |
03_contents.pdf | 2.13 MB | Adobe PDF | View/Open | |
04_chapter 1.pdf | 6.73 MB | Adobe PDF | View/Open | |
05_chapter 2.pdf | 17.59 MB | Adobe PDF | View/Open | |
06_chapter 3.pdf | 7.15 MB | Adobe PDF | View/Open | |
07_chapter 4.pdf | 9.92 MB | Adobe PDF | View/Open | |
08_chapter 5.pdf | 10.53 MB | Adobe PDF | View/Open | |
09_chapter 6.pdf | 4.81 MB | Adobe PDF | View/Open | |
10_chapter 7.pdf | 7.16 MB | Adobe PDF | View/Open | |
11_chapter 8.pdf | 9.77 MB | Adobe PDF | View/Open | |
12_chapter 9.pdf | 3.76 MB | Adobe PDF | View/Open | |
13_annexures.pdf | 13.48 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 4.01 MB | Adobe PDF | View/Open |
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