Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/516162
Title: Digital image processing and simulation technique for study of crystal defects in metallic materials
Researcher: Iyer, Sankaranarayanan
Guide(s): Gogawale, S V
Keywords: Crystal Defects
Electron Microscopy
Kinematical
Metallic Materials
Physical Sciences
Physics
Physics Applied
Simulation Technique
University: University of Mumbai
Completed Date: 1999
Abstract: Yes newline newline
Pagination: 244p
URI: http://hdl.handle.net/10603/516162
Appears in Departments:Department of Physics

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01_title.pdfAttached File248.54 kBAdobe PDFView/Open
02_prelim pages.pdf3.86 MBAdobe PDFView/Open
03_contents.pdf2.13 MBAdobe PDFView/Open
04_chapter 1.pdf6.73 MBAdobe PDFView/Open
05_chapter 2.pdf17.59 MBAdobe PDFView/Open
06_chapter 3.pdf7.15 MBAdobe PDFView/Open
07_chapter 4.pdf9.92 MBAdobe PDFView/Open
08_chapter 5.pdf10.53 MBAdobe PDFView/Open
09_chapter 6.pdf4.81 MBAdobe PDFView/Open
10_chapter 7.pdf7.16 MBAdobe PDFView/Open
11_chapter 8.pdf9.77 MBAdobe PDFView/Open
12_chapter 9.pdf3.76 MBAdobe PDFView/Open
13_annexures.pdf13.48 MBAdobe PDFView/Open
80_recommendation.pdf4.01 MBAdobe PDFView/Open
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