Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/508057
Title: | Design of aging aware circuit for device reliability issues |
Researcher: | Menezes, Siona Carmel |
Guide(s): | Goel, Nilesh |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Birla Institute of Technology and Science |
Completed Date: | 2023 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/508057 |
Appears in Departments: | Electrical & Electronics Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 72.19 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 254.58 kB | Adobe PDF | View/Open | |
03_content.pdf | 328.9 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 81.42 kB | Adobe PDF | View/Open | |
05_chapter1.pdf | 674.89 kB | Adobe PDF | View/Open | |
06_chapter2.pdf | 2.81 MB | Adobe PDF | View/Open | |
07_chapter3.pdf | 3.48 MB | Adobe PDF | View/Open | |
08_chapter4.pdf | 575.1 kB | Adobe PDF | View/Open | |
09_chapter5.pdf | 1.5 MB | Adobe PDF | View/Open | |
10_chapter6.pdf | 241.17 kB | Adobe PDF | View/Open | |
11_annexures.pdf | 278.18 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 261.3 kB | Adobe PDF | View/Open |
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