Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/508057
Title: Design of aging aware circuit for device reliability issues
Researcher: Menezes, Siona Carmel
Guide(s): Goel, Nilesh
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Birla Institute of Technology and Science
Completed Date: 2023
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/508057
Appears in Departments:Electrical & Electronics Engineering

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01_title.pdfAttached File72.19 kBAdobe PDFView/Open
02_prelim pages.pdf254.58 kBAdobe PDFView/Open
03_content.pdf328.9 kBAdobe PDFView/Open
04_abstract.pdf81.42 kBAdobe PDFView/Open
05_chapter1.pdf674.89 kBAdobe PDFView/Open
06_chapter2.pdf2.81 MBAdobe PDFView/Open
07_chapter3.pdf3.48 MBAdobe PDFView/Open
08_chapter4.pdf575.1 kBAdobe PDFView/Open
09_chapter5.pdf1.5 MBAdobe PDFView/Open
10_chapter6.pdf241.17 kBAdobe PDFView/Open
11_annexures.pdf278.18 kBAdobe PDFView/Open
80_recommendation.pdf261.3 kBAdobe PDFView/Open
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