Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/506450
Title: Bias stress stability and charge carrier trapping in high performance organic thin film transistors
Researcher: Bisoyi, Sibani
Guide(s): Tiwari, Shree Prakash
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Jodhpur
Completed Date: 2015
Abstract: Available newline newline
Pagination: xviii, 107p.
URI: http://hdl.handle.net/10603/506450
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File102.2 kBAdobe PDFView/Open
02_prelim pages.pdf585.39 kBAdobe PDFView/Open
03_table of contents.pdf149.48 kBAdobe PDFView/Open
04_abstract.pdf91.99 kBAdobe PDFView/Open
05_chapter 1.pdf782.82 kBAdobe PDFView/Open
06_chapter 2.pdf1.42 MBAdobe PDFView/Open
07_chapter 3.pdf1.82 MBAdobe PDFView/Open
08_chapter 4.pdf2.39 MBAdobe PDFView/Open
09_chapter 5.pdf1.54 MBAdobe PDFView/Open
10_annexure.pdf929.31 kBAdobe PDFView/Open
80_recommendation.pdf370.63 kBAdobe PDFView/Open
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