Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/505436
Title: | Deciphering Genomic Regions Associted with Traits of Terminal Heat Stress in Wheat using SNP Markers |
Researcher: | Kiran Devi |
Guide(s): | Sulekha Chahal and Ratan Tiwari |
Keywords: | Construction and Building Technology Engineering Engineering and Technology |
University: | Kurukshetra University |
Completed Date: | 2023 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/505436 |
Appears in Departments: | Department of Bio-Technology |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 196.05 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 436.12 kB | Adobe PDF | View/Open | |
03_content.pdf | 152.16 kB | Adobe PDF | View/Open | |
05_chapter1.pdf | 32.07 kB | Adobe PDF | View/Open | |
06_chapter2.pdf | 658.2 kB | Adobe PDF | View/Open | |
07_chapter3.pdf | 682.08 kB | Adobe PDF | View/Open | |
08_chapter4.pdf | 4.13 MB | Adobe PDF | View/Open | |
09_chapter5.pdf | 230.6 kB | Adobe PDF | View/Open | |
10_annexure.pdf | 1.02 MB | Adobe PDF | View/Open | |
11_chapter6.pdf | 180.58 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 436.12 kB | Adobe PDF | View/Open |
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