Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/505436
Title: Deciphering Genomic Regions Associted with Traits of Terminal Heat Stress in Wheat using SNP Markers
Researcher: Kiran Devi
Guide(s): Sulekha Chahal and Ratan Tiwari
Keywords: Construction and Building Technology
Engineering
Engineering and Technology
University: Kurukshetra University
Completed Date: 2023
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/505436
Appears in Departments:Department of Bio-Technology

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01_title.pdfAttached File196.05 kBAdobe PDFView/Open
02_prelim pages.pdf436.12 kBAdobe PDFView/Open
03_content.pdf152.16 kBAdobe PDFView/Open
05_chapter1.pdf32.07 kBAdobe PDFView/Open
06_chapter2.pdf658.2 kBAdobe PDFView/Open
07_chapter3.pdf682.08 kBAdobe PDFView/Open
08_chapter4.pdf4.13 MBAdobe PDFView/Open
09_chapter5.pdf230.6 kBAdobe PDFView/Open
10_annexure.pdf1.02 MBAdobe PDFView/Open
11_chapter6.pdf180.58 kBAdobe PDFView/Open
80_recommendation.pdf436.12 kBAdobe PDFView/Open
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