Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/494155
Title: Characterization Of Gate All Aound Mosfet
Researcher: Sachdeva, Kumar, Tarun
Guide(s): Agarwal,S.K and Kushwaha, A.K
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: J.C. Bose University of Science and Technology, YMCA
Completed Date: 2023
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/494155
Appears in Departments:Department of Electronics Engineering

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01_title.pdfAttached File172.68 kBAdobe PDFView/Open
02_prelim pages.pdf1.09 MBAdobe PDFView/Open
03_content.pdf339.48 kBAdobe PDFView/Open
04_abstract.pdf415.71 kBAdobe PDFView/Open
05_chapter 1.pdf2.69 MBAdobe PDFView/Open
06_chapter 2.pdf3.78 MBAdobe PDFView/Open
07_chapter 3.pdf2.08 MBAdobe PDFView/Open
08_chapter 4.pdf1.82 MBAdobe PDFView/Open
09_chapter 5.pdf3.87 MBAdobe PDFView/Open
10_chapter 6.pdf1.41 MBAdobe PDFView/Open
11_chapter 7.pdf511.58 kBAdobe PDFView/Open
13_annexures.pdf8.93 MBAdobe PDFView/Open
80_recommendation.pdf683.19 kBAdobe PDFView/Open
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