Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/485131
Title: | Pulsed laser deposition and characterization of alncoma tio2coma and znonedashxmgxo left bracket 0 less than or equal to x less than or equal to 0 point 7 right bracket semiconductor thin films |
Researcher: | Shukla, Gaurav |
Guide(s): | Khare, Alika |
Keywords: | Physical Sciences Physics Physics Applied |
University: | Indian Institute of Technology Guwahati |
Completed Date: | 2011 |
Abstract: | The focus of work presented in this thesis was to understand and optimize the pulsed laser deposition PLD process to fabricate thin films of three important wide band gap semiconductors AlN TiO2 and Zn1 xMgxO 0DxD0 7 These three materials were chosen due to their potential for opto electronic applications in the UV region AlN thin films were deposited onto Si 100 at room temperature in N2 ambient using PLD technique The use of pure Al metal as target in the present work instead of Al |
Pagination: | Not Available |
URI: | http://hdl.handle.net/10603/485131 |
Appears in Departments: | DEPARTMENT OF PHYSICS |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_fulltext.pdf | Attached File | 13.61 MB | Adobe PDF | View/Open |
04_abstract.pdf | 448.86 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 626.72 kB | Adobe PDF | View/Open |
Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).
Altmetric Badge: