Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/485131
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dc.coverage.spatialPhysics
dc.date.accessioned2023-05-24T06:58:28Z-
dc.date.available2023-05-24T06:58:28Z-
dc.identifier.urihttp://hdl.handle.net/10603/485131-
dc.description.abstractThe focus of work presented in this thesis was to understand and optimize the pulsed laser deposition PLD process to fabricate thin films of three important wide band gap semiconductors AlN TiO2 and Zn1 xMgxO 0DxD0 7 These three materials were chosen due to their potential for opto electronic applications in the UV region AlN thin films were deposited onto Si 100 at room temperature in N2 ambient using PLD technique The use of pure Al metal as target in the present work instead of Al
dc.format.extentNot Available
dc.languageEnglish
dc.relationNot Available
dc.rightsself
dc.titlePulsed laser deposition and characterization of alncoma tio2coma and znonedashxmgxo left bracket 0 less than or equal to x less than or equal to 0 point 7 right bracket semiconductor thin films
dc.title.alternativeNot available
dc.creator.researcherShukla, Gaurav
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.description.noteNot Available
dc.contributor.guideKhare, Alika
dc.publisher.placeGuwahati
dc.publisher.universityIndian Institute of Technology Guwahati
dc.publisher.institutionDEPARTMENT OF PHYSICS
dc.date.registered2005
dc.date.completed2011
dc.date.awarded2011
dc.format.dimensionsNot Available
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:DEPARTMENT OF PHYSICS

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