1. Shodhganga@INFLIBNET
  2. Indian Institute of Technology Bombay
  3. Department of Electrical Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/482286
Title: Sub bandgap impact ionization in Si nipin selector diode and its applications
Researcher: Das, Bhaskar
Guide(s): Ganguly, Udayan and Lodha, Saurabh
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Bombay
Completed Date: 2019
Abstract: Abstract attached newline newline
Pagination: NA
URI: http://hdl.handle.net/10603/482286
Appears in Departments:Department of Electrical Engineering

Files in This Item:
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01_title.pdfAttached File20.27 kBAdobe PDFView/Open
02_prelimpages.pdf332.76 kBAdobe PDFView/Open
03_abstract.pdf475.49 kBAdobe PDFView/Open
04_contents.pdf762.88 kBAdobe PDFView/Open
05_chapter_1.pdf797.27 kBAdobe PDFView/Open
06_chapter_2.pdf1.11 MBAdobe PDFView/Open
07_chapter_3.pdf786.11 kBAdobe PDFView/Open
08_chapter_4.pdf2.08 MBAdobe PDFView/Open
09_chapter_5.pdf1.21 MBAdobe PDFView/Open
10_chapter_6.pdf1.13 MBAdobe PDFView/Open
11_chapter_7.pdf1.39 MBAdobe PDFView/Open
12_chapter_8.pdf1.02 MBAdobe PDFView/Open
13_annexure.pdf591.68 kBAdobe PDFView/Open
80_recommendation.pdf362.93 kBAdobe PDFView/Open
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