Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/482052
Title: Security and testability issues in moders VLSI chips
Researcher: Ahlawat, Satyadev
Guide(s): Singh, Virendra
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Bombay
Completed Date: 2019
Abstract: Abstract attached newline newline
Pagination: NA
URI: http://hdl.handle.net/10603/482052
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File92 kBAdobe PDFView/Open
02_prelimpages.pdf833.36 kBAdobe PDFView/Open
03_abstract.pdf81.72 kBAdobe PDFView/Open
04_contents.pdf182.83 kBAdobe PDFView/Open
05_chapter_1.pdf378.12 kBAdobe PDFView/Open
06_chapter_2.pdf344.7 kBAdobe PDFView/Open
07_chapter_3.pdf923.64 kBAdobe PDFView/Open
08_chapter_4.pdf900.29 kBAdobe PDFView/Open
09_chapter_5.pdf418.03 kBAdobe PDFView/Open
10_chapter_6.pdf734.59 kBAdobe PDFView/Open
11_annexure.pdf206.44 kBAdobe PDFView/Open
80_recommendation.pdf120.15 kBAdobe PDFView/Open
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