Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/481183
Title: Metal work function induced threshold voltage variability in multi gate transistors
Researcher: Penugonda, Harsha Vardhan
Guide(s): Ganguly, Udayan and Ganguly, Swaroop
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Bombay
Completed Date: 2019
Abstract: Abstract attached newline newline
Pagination: NA
URI: http://hdl.handle.net/10603/481183
Appears in Departments:Department of Electrical Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File52.71 kBAdobe PDFView/Open
02_prelimpages.pdf521.27 kBAdobe PDFView/Open
03_abstract.pdf78.96 kBAdobe PDFView/Open
04_contents.pdf189.21 kBAdobe PDFView/Open
05_chapter_1.pdf1.2 MBAdobe PDFView/Open
06_chapter_2.pdf1.13 MBAdobe PDFView/Open
07_chapter_3.pdf1.21 MBAdobe PDFView/Open
08_chapter_4.pdf886.52 kBAdobe PDFView/Open
09_chapter_5.pdf1.84 MBAdobe PDFView/Open
10_appendix.pdf154.95 kBAdobe PDFView/Open
80_recommendation.pdf96.32 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: