Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/475173
Title: A Comparative Study of High Performance CMOS Multipliers Barrel Shifters and Modeling of NBTI Degradation in Nanometer Scale Digital VLSI Circuits
Researcher: Sati, Abhijit Rameshwar
Guide(s): Shekhar, Chandra
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Birla Institute of Technology and Science
Completed Date: 2009
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/475173
Appears in Departments:Electrical & Electronics Engineering

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01_title.pdfAttached File20.01 kBAdobe PDFView/Open
02_prelim pages.pdf558.45 kBAdobe PDFView/Open
03_content.pdf242.32 kBAdobe PDFView/Open
04_abstract.pdf107.12 kBAdobe PDFView/Open
05_chapter1.pdf575.95 kBAdobe PDFView/Open
06_chapter2.pdf799.83 kBAdobe PDFView/Open
07_chapter3.pdf2.63 MBAdobe PDFView/Open
08_chapter4.pdf1.55 MBAdobe PDFView/Open
09_chapter5.pdf714.05 kBAdobe PDFView/Open
10_chapter6.pdf1.01 MBAdobe PDFView/Open
11_chapter7.pdf262.89 kBAdobe PDFView/Open
12_annexures.pdf1.43 MBAdobe PDFView/Open
80_recommendation.pdf282.35 kBAdobe PDFView/Open
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