Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/474662
Title: | Investigations on Electronic Behavior and Stability Issues of Zinc Oxide ZnO based Thin Film Transistors |
Researcher: | Kandpal, Kavindra |
Guide(s): | Gupta, Navneet |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Birla Institute of Technology and Science |
Completed Date: | 2018 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/474662 |
Appears in Departments: | Electrical & Electronics Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 272.69 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 3.45 MB | Adobe PDF | View/Open | |
03_content.pdf | 675.88 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 217.59 kB | Adobe PDF | View/Open | |
05_chapter1.pdf | 2.25 MB | Adobe PDF | View/Open | |
06_chapter2.pdf | 4.07 MB | Adobe PDF | View/Open | |
07_chapter3.pdf | 4.59 MB | Adobe PDF | View/Open | |
08_chapter4.pdf | 5.38 MB | Adobe PDF | View/Open | |
09_chapter5.pdf | 4.48 MB | Adobe PDF | View/Open | |
10_chapter6.pdf | 535.8 kB | Adobe PDF | View/Open | |
11_annexures.pdf | 3.97 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 807.97 kB | Adobe PDF | View/Open |
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