Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/474662
Title: Investigations on Electronic Behavior and Stability Issues of Zinc Oxide ZnO based Thin Film Transistors
Researcher: Kandpal, Kavindra
Guide(s): Gupta, Navneet
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Birla Institute of Technology and Science
Completed Date: 2018
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/474662
Appears in Departments:Electrical & Electronics Engineering

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01_title.pdfAttached File272.69 kBAdobe PDFView/Open
02_prelim pages.pdf3.45 MBAdobe PDFView/Open
03_content.pdf675.88 kBAdobe PDFView/Open
04_abstract.pdf217.59 kBAdobe PDFView/Open
05_chapter1.pdf2.25 MBAdobe PDFView/Open
06_chapter2.pdf4.07 MBAdobe PDFView/Open
07_chapter3.pdf4.59 MBAdobe PDFView/Open
08_chapter4.pdf5.38 MBAdobe PDFView/Open
09_chapter5.pdf4.48 MBAdobe PDFView/Open
10_chapter6.pdf535.8 kBAdobe PDFView/Open
11_annexures.pdf3.97 MBAdobe PDFView/Open
80_recommendation.pdf807.97 kBAdobe PDFView/Open
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