Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/473283
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dc.date.accessioned2023-03-28T11:57:12Z-
dc.date.available2023-03-28T11:57:12Z-
dc.identifier.urihttp://hdl.handle.net/10603/473283-
dc.description.abstractThe present thesis was aimed to look into the optimum impurity content of Al and Ti in the host ZnO thin film for improved photoluminescence, nonlinear optical response and random lasing.Both types of films, Zn1-xAlxO (0â ¤xâ ¤0.10) and Zn1-xTixO (0â ¤xâ ¤0.05), were deposited onto fused silica as well as silicon substrates via pulsed laser deposition technique. The best crystalline quality and preferred c-axis orientation was exhibited by the film grown at x=0.05 and x=0.02 compositions for Zn1 newline
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dc.languageEnglish
dc.relation
dc.rightsself
dc.titleStudies on third order optical nonlinearity photoluminescence and random lasing in pulsed laser deposited Zn1 xAlxO 0and#8804;xand#8804;0 10 and Zn1 xTixO 0and#8804;xand#8804;0 05 thin films
dc.title.alternative
dc.creator.researcherBharti, Gyan Prakash
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.description.note
dc.contributor.guideKhare, Alika
dc.publisher.placeGuwahati
dc.publisher.universityIndian Institute of Technology Guwahati
dc.publisher.institutionDEPARTMENT OF PHYSICS
dc.date.registered2011
dc.date.completed2018
dc.date.awarded2018
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:DEPARTMENT OF PHYSICS

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